APhO 2026, Теория — Задача 2. Diffraction of X-rays by Structured and Evolving Targets

Theoretical Exam Q2 — Diffraction of X-rays by Structured and Evolving Targets (10 points) · 10 т.

Условие

Note

  1. Vectors are denoted by bold symbols (e.g., r\mathbf{r}, q\mathbf{q}).
  2. Assume that absorption is neglected and that the electric field is polarized perpendicular to the plane of incidence.

X-ray diffraction patterns arise because many tiny "wave sources" within a crystal interfere, and we can predict this by adding their complex amplitudes with the correct phases. Consider a monochromatic wave characterized by a (real) amplitude A≥0A \geq 0 and a phase ϕ\phi. We define the complex amplitude A~\tilde{A} as

A~=Aeiϕ,\tilde{A} = Ae^{i\phi},

so that the (real) amplitude of the wave is the magnitude (absolute value) of A~\tilde{A}, and ϕ\phi is its phase. Thus A~\tilde{A} conveniently encodes both magnitude and phase in a single complex number. In this problem set, we define a dimensionless intensity by the squared magnitude of the total complex amplitude:

I=∣A~∣2=A2.I = |\tilde{A}|^2 = A^2.

Common experimental and geometric proportionality factors, such as detector response, incident-beam normalization, and common propagation factors, are absorbed into this definition. By contrast, the single-electron scattering amplitude f0f_0 is retained explicitly as the amplitude scale for scattering from one point electron.

When a crystalline material is exposed to an incident wave, the wave is diffracted by the crystal lattice and the diffracted parts interfere with one another. The intensity of the resulting diffracted wave can be calculated by adding the complex amplitudes of the individual diffracted waves, taking into account the phase differences between them, and then computing the squared magnitude of the resulting total complex amplitude. Diffraction primarily arises from interactions with electrons, and contributions from heavier particles such as nuclei are typically negligible. The amplitude of the wave diffracted by a single point electron depends only on R=∣R∣R = |\mathbf{R}|, the distance from the electron to the detector. Since RR is much larger than the dimensions of the sample, its variation across the sample can be neglected. Therefore, the total diffracted wave can be accurately determined by properly accounting for the phase differences between individual diffracted waves, while their amplitudes are assumed to be constant.

Let ki\mathbf{k}_i and kf\mathbf{k}_f denote the wavevectors of the incident and diffracted waves, respectively. An incident plane wave with wavevector ki\mathbf{k}_i is diffracted into a wave with wavevector kf\mathbf{k}_f. The momentum transfer is defined as

q=kf−ki\mathbf{q} = \mathbf{k}_f - \mathbf{k}_i

and their magnitudes are assumed to be equal, because the wavelength is unchanged:

k≡∣ki∣=∣kf∣=2πλ.k \equiv |\mathbf{k}_i| = |\mathbf{k}_f| = \frac{2\pi}{\lambda}.

A.1 Consider two point electrons located at positions r1\mathbf{r}_1 and r2\mathbf{r}_2, and define r≡r2−r1\mathbf{r} \equiv \mathbf{r}_2 - \mathbf{r}_1. A detector is located at P\mathbf{P}, and we define R≡P−r1\mathbf{R} \equiv \mathbf{P} - \mathbf{r}_1. A plane wave Ei(r)∝eiki⋅rE_i(\mathbf{r}) \propto e^{i\mathbf{k}_i \cdot \mathbf{r}} is incident on the two electrons, and the diffracted wave is observed in the far field along the direction kf\mathbf{k}_f. In part A, the common time-dependent factor e−iωte^{-i\omega t} is suppressed, since only relative spatial phases are relevant.

Under the far-field approximation, R≡∣R∣≫∣r∣R \equiv |\mathbf{R}| \gg |\mathbf{r}|, keep only the leading-order term in ∣r∣/R|\mathbf{r}|/R and write the outgoing geometric path difference, ΔLout≡∣P−r1∣−∣P−r2∣\Delta L_{\text{out}} \equiv |\mathbf{P} - \mathbf{r}_1| - |\mathbf{P} - \mathbf{r}_2|, in terms of r\mathbf{r} and kf\mathbf{k}_f, or equivalently kf/kf\mathbf{k}_f/k_f. [0,6 т.]

A.2 Using your result from A.1 and accounting for the position-dependent phase of the incident wave at r1\mathbf{r}_1 and r2\mathbf{r}_2, find the phase difference between the two diffracted contributions at the detector, expressed in terms of q\mathbf{q} and r\mathbf{r}. The phase difference is defined as Δϕ≡ϕ1−ϕ2\Delta\phi \equiv \phi_1 - \phi_2, where ϕ1\phi_1 and ϕ2\phi_2 are the phases of the contributions from the electrons at r1r_1 and r2r_2. [0,4 т.]

A.3 Express the total complex amplitude of the diffracted wave from these two electrons in terms of q\mathbf{q} and r\mathbf{r}. You may ignore any overall common phase factor, since it does not affect the intensity. Assume that the real amplitude of a diffracted wave from a single point electron is a constant f0f_0, independent of position. [0,6 т.]

A.4 Express the intensity of diffracted waves from those two electrons in terms of q\mathbf{q} and r\mathbf{r}. [0,4 т.]

B.1 Consider two point-like electrons located at positions r1\mathbf{r}_1 and r2\mathbf{r}_2, with r≡r2−r1\mathbf{r} \equiv \mathbf{r}_2 - \mathbf{r}_1. A beam of wavelength λ0\lambda_0 (so k=2π/λ0k = 2\pi/\lambda_0 and ω=2πc/λ0\omega = 2\pi c/\lambda_0) illuminates the electrons, and the diffracted wave is observed in the far field along kf\mathbf{k}_f. We model the incident field as a plane wave with a time-dependent random phase,

Ei(r,t)=A exp⁡[i(ki⋅r−ωt+ϕ(t))],E_i(\mathbf{r}, t) = A\, \exp[i(\mathbf{k}_i \cdot \mathbf{r} - \omega t + \phi(t))],

where ϕ(t)\phi(t) is piecewise constant and undergoes random phase jumps at regular time intervals of duration

t0≡L0c,t_0 \equiv \frac{L_0}{c},

with L0L_0 the (given) longitudinal coherence length. At the beginning of each interval of length t0t_0, ϕ(t)\phi(t) is reset to a new independent value uniformly distributed on [0,2π)[0, 2\pi). Let I0I_0 denote the (time-averaged) intensity at the detector that would be obtained from a single electron in the same geometry. In this problem, the detector is assumed to measure a time-averaged intensity. That is, it does not resolve the individual random phase jumps. Instead, it records the average of the instantaneous intensity over a time much longer than the phase-jump interval t0t_0: ⟨I⟩t≡⟨∣E(t)∣2⟩t\langle I \rangle_t \equiv \langle |E(t)|^2 \rangle_t. Here ⟨⋯ ⟩t\langle \cdots \rangle_t denotes an average over many phase-jump intervals.

Using the phase-jump model above, derive the time-averaged total intensity ⟨I⟩t\langle I \rangle_t at the detector from the two electrons. Your final result should be written in terms of I0I_0, q≡kf−ki\mathbf{q} \equiv \mathbf{k}_f - \mathbf{k}_i, the separation vector r\mathbf{r}, the wavelength λ0\lambda_0, and the coherence length L0L_0. Assume the detector averages over times much longer than t0t_0. [2,3 т.]

C.1 Part C: Non-point particle effect (1.0 pts)

An electron is often treated as a classical point particle, but in a more realistic model its charge may be regarded as being distributed over a finite spatial region. Consider two idealized charge distributions: (i) an ideal point charge located at r=0\mathbf{r} = 0, whose scattering amplitude is A1(q)=Q0A_1(\mathbf{q}) = Q_0, (ii) an extended Gaussian charge distribution ρ2(r)=ρ0exp⁡(−r2R02)\rho_2(\mathbf{r}) = \rho_0 \exp\left(-\frac{r^2}{R_0^2}\right), r=∣r∣r = |\mathbf{r}|.

The constants Q0Q_0 and ρ0\rho_0 are chosen so that the total charge is the same in both cases:

Q0=∫ρ2(r) d3r.Q_0 = \int \rho_2(\mathbf{r})\, d^3r.

Here d3rd^3r denotes the volume element in three-dimensional space. In Cartesian coordinates, d3r=dx dy dzd^3r = dx\,dy\,dz and ∫R3\int_{\mathbb{R}^3} means integration over all space. Useful identities (may be used without proof):

∫0∞e−r2/R02 4πr2 dr=π3/2R03,∫R3e−αr2eik⋅r d3r=(πα)3/2exp⁡(−k24α),α>0.\int_0^\infty e^{-r^2/R_0^2}\, 4\pi r^2\, dr = \pi^{3/2} R_0^3, \qquad \int_{\mathbb{R}^3} e^{-\alpha r^2} e^{i\mathbf{k}\cdot\mathbf{r}}\, d^3\mathbf{r} = \left(\frac{\pi}{\alpha}\right)^{3/2} \exp\left(-\frac{k^2}{4\alpha}\right), \qquad \alpha > 0.

Obtain the relation among Q0Q_0, ρ0\rho_0, and R0R_0. [0,4 т.]

C.2 Evaluate the amplitude

A2(q)≡∫R3ρ2(r)eiq⋅r d3rA_2(\mathbf{q}) \equiv \int_{\mathbb{R}^3} \rho_2(\mathbf{r}) e^{i\mathbf{q}\cdot\mathbf{r}}\, d^3\mathbf{r}

and compare it with the point-charge amplitude A1(q)=Q0A_1(\mathbf{q}) = Q_0. [0,4 т.]

C.3 Estimate the ratio of the diffracted intensities, I2I1\dfrac{I_2}{I_1}, for these two idealized cases when q=2R0q = \dfrac{2}{R_0}. [0,2 т.]

D.1 Imagine that the surface of a film (i.e., the top atomic layers) is not perfectly flat, but exhibits surface roughness. A common model is to assume that the local film thickness (measured in monolayers) follows a Gaussian distribution. Let NN denote the local number of completed monolayers within a lateral coherence area of the beam. We assume that NN varies across the surface and is normally distributed with mean Nˉ\bar{N} and standard deviation σ\sigma (both in units of monolayers):

P(N)=12π σexp⁡[−(N−Nˉ)22σ2].P(N) = \frac{1}{\sqrt{2\pi}\,\sigma} \exp\left[-\frac{(N - \bar{N})^2}{2\sigma^2}\right].

(For the purpose of evaluating averages, you may treat NN as a continuous variable.) Let dd be the spacing between adjacent atomic layers (monolayers), and let qzq_z denote the component of the scattering vector q=kf−ki\mathbf{q} = \mathbf{k}_f - \mathbf{k}_i normal to the flat surface of the film, i.e., qz=q⋅z^q_z = \mathbf{q} \cdot \hat{\mathbf{z}}. For an integer number of monolayers NN, the scattering amplitude is

AN(qz)=∑n=0N−1eiqznd=1−eiqzNd1−eiqzd.A_N(q_z) = \sum_{n=0}^{N-1} e^{iq_z n d} = \frac{1 - e^{iq_z N d}}{1 - e^{iq_z d}}.

When averaging over the Gaussian thickness distribution, we treat NN as a continuous variable and use the closed-form expression

AN(qz)≡1−eiqzNd1−eiqzdA_N(q_z) \equiv \frac{1 - e^{iq_z Nd}}{1 - e^{iq_z d}}

as the corresponding continuous extension. Assume the measured diffraction intensity is obtained from the coherent average amplitude,

I(qz)≡∣⟨A(qz)⟩∣2,⟨A(qz)⟩=∫−∞∞P(N) AN(qz) dN.I(q_z) \equiv |\langle A(q_z) \rangle|^2, \qquad \langle A(q_z) \rangle = \int_{-\infty}^{\infty} P(N)\, A_N(q_z)\, dN.

Calculate the intensity ratios

I(qz,σ=0.4,Nˉ=5)I(qz,σ=0,Nˉ=5)\frac{I(q_z, \sigma = 0.4, \bar{N} = 5)}{I(q_z, \sigma = 0, \bar{N} = 5)}

at

qz=π2dandqz=2πd,q_z = \frac{\pi}{2d} \quad \text{and} \quad q_z = \frac{2\pi}{d},

respectively. If needed, evaluate the second case by taking the appropriate limit. [2,4 т.]

E.1 Imagine a thin film with a simple cubic structure grown on a substrate in a layer-by-layer mode, i.e., each monolayer is completed before the next monolayer starts to grow. Let dd be the spacing between adjacent atomic layers (monolayers), and let qzq_z denote the component of q=kf−ki\mathbf{q} = \mathbf{k}_f - \mathbf{k}_i normal to the flat surface of the film, i.e., qz=q⋅z^q_z = \mathbf{q} \cdot \hat{\mathbf{z}}. As the film is being grown, the thickness of the film changes, and so does the diffraction intensity at q=πdz^\mathbf{q} = \frac{\pi}{d}\hat{\mathbf{z}}. The calculation is performed at the specified out-of-plane momentum transfer, and all monolayer contributions are coherently summed.

If the film starts to grow at t=0t = 0 and the time required to complete one monolayer is t0t_0, obtain the diffraction intensity ratio

I(t=0.8t0)I(t=3.6t0)\frac{I(t = 0.8 t_0)}{I(t = 3.6 t_0)}

measured at q=πdz^\mathbf{q} = \frac{\pi}{d}\hat{\mathbf{z}}. Assume that during each monolayer-growth interval, the fractional coverage of the top layer increases linearly from 0 to 1, so that at time t=(N+θ)t0t = (N + \theta)t_0, there are NN completed monolayers and a fractional coverage θ\theta of the next monolayer. [2,3 т.]

Решение


Оригинал в Архива: T2.pdf · официални решения: T2_sol.pdf