IPhO 2004, Теория — Задача 3. Atomic Probe Microscope

Theoretical Question 3: Atomic Probe Microscope · 10 т.

Условие

Atomic probe microscopes (APMs) are powerful tools in the field of nano-science. The motion of a cantilever in APM can be detected by a photo-detector monitoring the reflected laser beam, as shown in Fig. 3.1. The cantilever can move only in the vertical direction and its displacement zz as a function of time tt can be described by the equation

md2zdt2+bdzdt+kz=F,(3.1)m\frac{d^2z}{dt^2}+b\frac{dz}{dt}+kz=F, \qquad \text{(3.1)}

where mm is the cantilever mass, k=mω02k=m\omega_0^2 is the spring constant of the cantilever, bb is a small damping coefficient satisfying ω0≫(b/m)>0\omega_0 \gg (b/m)>0, and finally FF is an external driving force of the piezoelectric tube.

Schematic of a scanning probe microscope: a laser beam reflects off a cantilever (tip mass m, spring k) above a sample of stacked atoms, at height z=0, into a photo-detector whose output Vi=c2z goes to the input of a lock-in amplifier; a reference signal source VR feeds the lock-in amplifier and a phase shifter, whose output V'R drives the piezotube (force F) attached to the cantilever; the amplifier has an output line. An inset at lower right shows the mechanical model: piezotube, force F, spring k and tip mass m.
Figure 3.1 A schematic diagram for a scanning probe microscope (SPM). The inset in the lower right corner represents a simplified mechanical model to describe the coupling of the piezotube with the cantilever.

[Part A]

(a) [1.5 points] When F=F0sin⁡ωtF=F_0\sin\omega t, z(t)z(t) satisfying Eq. (3.1) can be written as z(t)=Asin⁡(ωt−ϕ)z(t)=A\sin(\omega t-\phi), where A>0A>0 and 0≤ϕ≤π0\le\phi\le\pi. Find the expression of the amplitude AA and tan⁡ϕ\tan\phi in terms of F0F_0, mm, ω\omega, ω0\omega_0, and bb. Obtain AA and the phase ϕ\phi at the resonance frequency ω=ω0\omega=\omega_0.

(b) [1 point] A lock-in amplifier shown in Fig.3.1 multiplies an input signal by the lock-in reference signal, VR=VR0sin⁡ωtV_R=V_{R0}\sin\omega t, and then passes only the dc (direct current) component of the multiplied signal. Assume that the input signal is given by Vi=Vi0 sin⁡(ωit−ϕi)V_i=V_{i0}\ \sin(\omega_i t-\phi_i). Here VR0V_{R0}, Vi0V_{i0}, ωi\omega_i, and ϕi\phi_i are all positive given constants. Find the condition on ω\omega (>0>0) for a non-vanishing output signal. What is the expression for the magnitude of the non-vanishing dc output signal at this frequency?

(c) [1.5 points] Passing through the phase shifter, the lock-in reference voltage VR=VR0sin⁡ωtV_R=V_{R0}\sin\omega t changes to VR′=VR0sin⁡(ωt+π/2)V'_R=V_{R0}\sin(\omega t+\pi/2). VR′V'_R, applied to the piezoelectric tube, drives the cantilever with a force F=c1VR′F=c_1V'_R. Then, the photo-detector converts the displacement of the cantilever, zz, into a voltage Vi=c2zV_i=c_2z. Here c1c_1 and c2c_2 are constants. Find the expression for the magnitude of the dc output signal at ω=ω0\omega=\omega_0.

(d) [2 points] The small change Δm\Delta m of the cantilever mass shifts the resonance frequency by Δω0\Delta\omega_0. As a result, the phase ϕ\phi at the original resonance frequency ω0\omega_0 shifts by Δϕ\Delta\phi. Find the mass change Δm\Delta m corresponding to the phase shift Δϕ=π/1800\Delta\phi=\pi/1800, which is a typical resolution in phase measurements. The physical parameters of the cantilever are given by m=1.0×10−12 kgm=1.0\times10^{-12}\ \mathrm{kg}, k=1.0 N/mk=1.0\ \mathrm{N/m}, and (b/m)=1.0×103 s−1(b/m)=1.0\times10^{3}\ \mathrm{s^{-1}}. Use the approximations (1+x)a≈1+ax(1+x)^a\approx1+ax and tan⁡(π/2+x)≈−1/x\tan(\pi/2+x)\approx-1/x when ∣x∣≪1|x|\ll1.

[Part B]

From now on let us consider the situation that some forces, besides the driving force discussed in Part A, act on the cantilever due to the sample as shown in Fig.3.1.

(e) [1.5 points] Assuming that the additional force f(h)f(h) depends only on the distance hh between the cantilever and the sample surface, one can find a new equilibrium position h0h_0. Near h=h0h=h_0, we can write f(h)≈f(h0)+c3(h−h0)f(h)\approx f(h_0)+c_3(h-h_0), where c3c_3 is a constant in hh. Find the new resonance frequency ω0′\omega'_0 in terms of ω0\omega_0, mm, and c3c_3.

(f) [2.5 points] While scanning the surface by moving the sample horizontally, the tip of the cantilever charged with Q=6eQ=6e encounters an electron of charge q=eq=e trapped (localized in space) at some distance below the surface. During the scanning around the electron, the maximum shift of the resonance frequency Δω0 (=ω0′−ω0)\Delta\omega_0\,(=\omega'_0-\omega_0) is observed to be much smaller than ω0\omega_0. Express the distance d0d_0 from the cantilever to the trapped electron at the maximum shift in terms of mm, qq, QQ, ω0\omega_0, Δω0\Delta\omega_0, and the Coulomb constant kek_e. Evaluate d0d_0 in nm (1 nm=1×10−9 m1\ \mathrm{nm}=1\times10^{-9}\ \mathrm{m}) for Δω0=20 s−1\Delta\omega_0=20\ \mathrm{s^{-1}}.

The physical parameters of the cantilever are m=1.0×10−12 kgm=1.0\times10^{-12}\ \mathrm{kg} and k=1.0 N/mk=1.0\ \mathrm{N/m}. Disregard any polarization effect in both the cantilever tip and the surface. Note that ke=1/4πε0=9.0×109 N⋅m2/C2k_e=1/4\pi\varepsilon_0=9.0\times10^{9}\ \mathrm{N\cdot m^2/C^2} and e=−1.6×10−19 Ce=-1.6\times10^{-19}\ \mathrm{C}.

Отговори

Решение


Оригинал в Архива: 3.pdf · официални решения: 3_sol.pdf