IPhO 2018, Експеримент — Задача 1. Paper transistor

Paper transistor (10 points) · 23 юли 2018 г. · 10 т.

Внимание: Бележка към темата

One complete connected Paper transistor experiment with Parts A–D and 20 native requests: 13 question, 19 official key and 15 native answer-sheet pages. The key version v1.4 is dated July 23, 2018. Complete apparatus, numeric sample measurements, derivations, graphs and blank forms retained. Printed source discrepancies remain with attributed local notes. No overall time limit, separate residual-current value or missing time measurements are invented.

Official key edition

Solutions to Experimental Problem 1 — Paper transistor. Authors: Elvira Fortunato, Luís Pereira, Rui Igreja, Paul Grey, Inês Cunha, Diana Gaspar, Rodrigo Martins. July 23, 2018, v1.4. The obtained historical key carries a “Confidential” watermark.

Условие

Electronic technology in modern society is based on a simple, yet powerful device: the transistor, which can be used both as a switch and as an amplifier. The switch mode is used for storage and processing of digital information.

Here we will analyse two types of Field Effect Transistors (FET): JFET (Junction Field Effect Transistor) and the TFT (Thin Film Transistor).

We shall briefly explain here how a FET works. A FET is a non-linear 3 terminal device (the terminals being named Gate: G; Source: S; and Drain: D) that can control the current flow between Source and Drain by acting upon the voltage applied between the Gate and the Source. In a simple, although imperfect analogy, a FET works similarly to a water tap, the knob acting as the Gate controlling the water flow.

Complete native three-panel n-channel JFET cross-section, hydraulic analogy and circuit symbol, all G/S/D labels, p/n legend, current arrows and tap/flow.
Figure 1. Scheme of an n-channel JFET (left), its hydraulic analogy (middle) and electric circuit symbol (right). The arrows in the JFET scheme indicate the flow of the electric current between Source (S) and Drain (D) through the narrow n-channel. The width of the channel depends on the applied voltage between the Gate (G) and the Source (S).

The Junction-FET (JFET) relies upon the properties of the junction between two types of a semiconducting material, such as p and n doped silicon, hence its name. A JFET has a narrow channel through which the current flows between Source and Drain, and in a n-channel FET this channel is made of n-type material. The width of such channel can be controlled in a precise way by applying a negative voltage between the Gate and the Source, VGS=VG−VSV_{GS}=V_G-V_S. For a fixed VGSV_{GS}, the current flowing between Source and Drain depends non-linearly on the applied voltage between Drain and Source, VDS=VD−VSV_{DS}=V_D-V_S. For small VDSV_{DS} voltages, however, the current does depend linearly on the applied voltage, thus the JFET displays ohmic behaviour. The output resistance, RDS=VDS/IDSR_{DS}=V_{DS}/I_{DS}, however, does depend strongly on the applied VGSV_{GS} voltage, closely following the law:

RDS=RDS01−VGS/VP,(1)R_{DS}=\frac{R_{DS}^0}{1-V_{GS}/V_P},\qquad (1)

where RDS0R_{DS}^0 is the output resistance at VGS=0V_{GS}=0 and VP<0V_P<0 is a JFET parameter called the pinch-off voltage. Clearly, at the pinch-off voltage, the FET blocks current flow.

For any fixed VGS>VPV_{GS}>V_P, the current between Source and Drain will start to depart from the linear behaviour as we increase VDSV_{DS}, and will at some point saturate at an almost constant value. Let IDSSI_{DSS} be the saturation current when VGS=0V_{GS}=0. In the saturation regime (large applied VDSV_{DS}), the saturation current will depend on VGSV_{GS} in the following way:

IDS=IDSS(1−VGS/VP)2.(2)I_{DS}=I_{DSS}(1-V_{GS}/V_P)^2.\qquad (2)

We should stress two very important characteristics of a JFET. Although its voltage controlled output resistance can be quite low, the input resistance (RGS=VGS/IGSR_{GS}=V_{GS}/I_{GS}) is extremely high, typically larger than 109 Ω10^9\ \Omega, so this device uses very little input current. Also, the capacitance of a small JFET is quite low making it a very fast device than can 'open and close' beyond MHz rates.

We now proceed to describe how a different type of FET, the TFT, works.

As any other FET, the TFT permits the control of a current between two contacts, the Drain and Source electrodes, by means of an applied potential at the third electrode, the Gate.

The Gate electrode is physically separated from the semiconductor layer by a dielectric that allows for the establishment of a vertical electrical field that will control the free charge carriers existing in the semiconductor (field effect). The dielectric layer can be replaced by an electrolytic membrane such as paper where mobile ions exist (see Figure 2) and in this case the voltage applied at the Gate will push ions with opposite charge to the semiconductor interface, creating a sheet of ionic charges that will modulate the free carriers' density existing within the semiconductor (Electrolyte Gated Transistors - EGTs). Researchers at Universidade Nova, Lisbon, were pioneers in developing in 2008 the "paper transistor", and are world leaders in this field.

Complete native paper thin-film-transistor cross-section including S/D/G electrodes, A/B/C material layers, X metal contact and all conventional current arrows.
Figure 2. Scheme of the paper thin film transistor (TFT) to be used in this problem. S - Source; D - Drain; G - Gate; A - paper (dielectric); B - substrate; C - semiconductor layer (Gallium-Indium-Zinc oxide (GIZO)); X - Metal contacts. The arrows indicate the conventional current flow.

Similarly to JFETs, TFT transistors can operate in two fundamental operation modes, a linear mode and a saturation mode. In contrast to JFET, TFT intrinsic capacitance is a relevant parameter for the device performance.

In this experimental problem you will examine how an n-channel JFET and a paper TFT work.

You will determine the Characteristic Curves (CCs) of these devices by measuring the current between S and D (IDSI_{DS}) through the application of distinct voltages at G (VGSV_{GS}) and D (VDSV_{DS}).

The two most important CCs are the output and the transfer curves:

  • Output Curve: For this curve the current between Source and Drain (IDSI_{DS}) will be measured and plotted as a function of the voltage between Source and Drain (VDSV_{DS}), with VDSV_{DS} swept from 0 V0\ \mathrm V up to +3 V+3\ \mathrm V, in steps, while keeping VGSV_{GS} constant.
  • Transfer Curve: For this curve IDSI_{DS} will be measured and plotted against VGSV_{GS}. VDSV_{DS} will be kept constant at a suitable value for the transistor to work in the saturation mode and VGSV_{GS} will be swept in steps from −3-3 to 0 V0\ \mathrm V.

Equipment

The following set of equipment (Figure 3) is provided for this experimental problem:

  1. multimeter
  2. JFET transistor (provided inside a labelled plastic bag)
  3. cables (10) with alligator clips
  4. flat alligator clips (4, provided inside a plastic bag)
  5. battery pack (4×1.5 V4\times1.5\ \mathrm V)
  6. battery holder
  7. mini-breadboard with support
  8. jumper wires (3) to connect to the mini-breadboard
  9. HB pencil
  10. silver ink conductive pen (Circuit Scribe)
  11. chronometer
  12. sheet of paper with printed circuits and an embedded TFT that uses paper as dielectric layer (Figure 4)
  13. bag with writing material (1 pen, 1 pencil, 1 eraser/sharpener, 1 ruler)
Entire native apparatus photograph with every numbered item 1–13, complete ruler/wires/pack/breadboard/transistor/paper/meter/pens/chronometer and full photograph boundaries.
Figure 3. Equipment set.
Complete printed circuit board and dimensioned carbon resistance track, all 1/2/3/4/R1/R2/RT1/RT2/RT3 labels, enlarged step, full track ends and 1cm/0.5mm dimension arrows.
Figure 4. Left: Sheet of paper with printed circuits included in the equipment: paper (1), silver conductive tracks (2), carbon resistive tracks (3), paper transistor (4), voltage divider resistances (R1R_1 and R2R_2). Right: Physical dimensions of the voltage divider resistances (the steps of 0.5 mm are constant for each segment).

Important precaution:

Do not fold the sheet of paper with the printed circuits and embedded transistor as this will easily damage it. Try to leave it as flat as possible during measurements in order to reach best results.

For the measurements it is important to take into account the following important information:

  • The multimeter should always be operated in DC mode.
  • The multimeter does not autorange and you should carefully choose the most appropriate ranges for your measurements. In case a overflow occurs the display will show either "1" or "-1" (left justified on the display), for positive and negative values, respectively, and you should change to a lower range.
  • The low-current ranges are protected by a 315 mA315\ \mathrm{mA} fuse. Avoid by all means to create a short circuit between the battery and the multimeter because a high current will blow up the fuse!
  • The internal resistance of the multimeter when operating in voltmeter mode is 10 MΩ10\ \mathrm{M\Omega}.
  • When operating as ammeter, the internal resistance of the multimeter depends on the range as shown in the following table:
RangeRint/ΩR_{int}/\Omega
200 mA200\ \mathrm{mA}1.0
20 mA20\ \mathrm{mA}10
2 mA2\ \mathrm{mA}100

Table 1. Internal resistance of the provided multimeter when operated as ammeter.

Thus, when the multimeter is being used in DC ammeter mode, there will be a voltage drop up to 200 mV200\ \mathrm{mV} between its terminals at full scale when operated in any of the 3 available DC ranges.

Source note: The original overflow instruction says “change to a lower range”; that printed instruction is retained.

Part A. Circuit dimensioning (2.5 points)

To achieve the necessary VDSV_{DS} and VGSV_{GS} voltages you will use two carbon resistors printed on paper (R1R_1 and R2R_2, see Fig. 4) and voltage divider circuitry to dimension the circuit for the right potential drops. R1R_1 and R2R_2 will be the total resistance (RtotR_{tot}) of a voltage divider circuit. When applying a constant voltage (in this case about 3 V3\ \mathrm V from the battery) across R1R_1, for instance, we will see a voltage drop along it from 3 V3\ \mathrm V (VinV_{in}, the positive contact of the battery) to ground (0 V0\ \mathrm V; from now on, we designate as ground the common contact of the two battery packs). RtotR_{tot} can be divided into essentially two resistances (RxR_x and RyR_y) to achieve the desirable VoutV_{out} (Figure 5).

Complete pair of equivalent unloaded voltage-divider circuits, both grounds, Vin/Vout/Rtot/Rx/Ry and equality sign.
Figure 5. Voltage divider circuit.

A.1 Write down the expression for the output voltage, VoutV_{out}, as a function of VinV_{in} and resistances RxR_x and RyR_y. [0,2 т.]

A.2 Measure the resistance of the three test resistors on the bottom part of the sheet (RT1R_{T1}, RT2R_{T2} and RT3R_{T3}) with the multimeter. Carry out enough measurements with different positions on the silver contacts. Enter the values in the Answer Sheet. Calculate the average value and estimate the uncertainty for the resistance of each test resistor. [0,5 т.]

A.3 Show that the resistance of a square thin film with a certain resistivity, ρ\rho, should be independent of the length of its side. This size-independent resistance is called sheet resistance and is denoted R□R_{\square}. [0,3 т.]

A.4 Calculate the average value of the sheet resistance of the carbon film from the data in A.2 and obtain the resistivity, ρ\rho, of the carbon film with an estimation of its uncertainty (consider a thickness tt of the carbon film of 20±1 μm20\pm1\ \mathrm{\mu m}). [0,4 т.]

A.5 Show that the theoretical value of the R1R_1 and R2R_2 resistances is R1=R2=κR□R_1=R_2=\kappa R_{\square}, κ∼14.2897\kappa\sim14.2897. Measure R1R_1 and R2R_2 and write down the values in the Answer Sheet. Determine the experimental value of κ\kappa and compare it with the theoretical value. [0,5 т.]

Using the provided silver ink pen, draw 7 equally spaced conductive lines along each of the provided resistors (as exemplified in Figure 6). These individual lines will serve as the contact points for the voltage dividers.

Entire native two-track contact scheme with Z/V/W, all A–G/H–N contacts, taper steps and seven silver contact lines on each track.
Figure 6. Line drawing example and naming scheme of the contact points.

A.6 Measure the resistances RxR_x and RyR_y for all contact points. RxR_x is defined as the resistance between the contact point and points V (resistor 1) or W (resistor 2), and RyR_y is defined as the resistance between the contact point and point Z. Fill the provided tables in the Answer Sheet. [0,3 т.]

Insert the 4 AA batteries in the battery holder. Please observe carefully the correct battery polarity and make sure you do not produce a short circuit. Then, physically connect the battery pack as depicted in Figure 7. Make sure you do not damage the silver tracks with the alligator clips.

Complete original printed board and two 3V batteries, all wires, Z/V/W labels, test resistors and full lower return path.
Figure 7. Battery connections

A.7 Measure VoutV_{out} at each contact point, VoutV_{out} being the voltage measured with respect to point Z and enter the values in the provided tables in the Answer Sheet. [0,3 т.]

This concludes the circuit dimensioning part and you can now proceed to measure the CCs of the JFET transistor.

Part B. Characteristic Curves of the commercial JFET transistor (4.5 points)

In order to characterise the JFET transistor you will use the setup depicted in Figure 8. Start by identifying the three contacts (S, D and G) on the provided JFET transistor - pay attention to the correct identification of the contacts, as the device is not symmetric! You may use the provided minibreadboard with support to mount the JFET transistor. The provided jumper wires are to be used with the mini-breadboard.

Using the provided cables, connect the Gate and the Source of the transistor to ground (point Z of the circuit, at 0 V0\ \mathrm V). Throughout this part of the problem, the Source of the JFET should always be kept connected to ground.

Complete native JFET measuring circuit with meter, battery connections, red arrows, dashed excluded TFT region, complete upper S/G/D transistor inset and complete lower breadboard connectivity inset.
Figure 8. Setup for the determination of the JFET characteristic curves. The part of the circuit inside the dashed region that includes the TFT is not to be used in part B of the problem. The top inset shows how to identify the Gate, Source and Drain of the JFET transistor. The bottom inset shows how the holes of the mini-breadboard are connected. All holes in a numbered column are internally interconnected and isolated from the holes of other columns. The picture of the multimeter is merely illustrative: you are in charge of selecting the appropriate measuring mode and range in the rotary selector of the multimeter.

B.1 Connect the gate of the transistor to ground (VGS=0V_{GS}=0). Then connect one of the cables of the multimeter, that should be used in DC current mode, to the drain of the transistor and with the other cable touch the point with the highest voltage available in the voltage dividers. Write down in the answer sheet the value of the current IDSI_{DS}. [0,2 т.]

B.2 Measure the current IDSI_{DS} for different positive voltages applied to the Drain, while keeping VGS=0V_{GS}=0. Then change the circuit to apply a negative voltage between the Gate and the Source of the transistor (VGS<0V_{GS}<0) and repeat the measurements of IDSI_{DS} as a function of the positive applied voltage between Drain and Source. Fill with your values the tables provided in the Answer Sheet. [0,8 т.]

When the voltage divider circuit is connected to a low resistance load (Figure 9), the voltage values provided by the voltage divider, VoutLV_{out}^L, are different from the nominal values VoutV_{out} measured when the load is a high resistance, such as the case of a high impedance voltmeter.

Entire loaded voltage-divider circuit with Vin/VoutL/Rx/Ry/RL and both ground connections.
Figure 9. Voltage divider with a load.

B.3 Consider that the voltage divider is connected to a load RLR_L. Obtain an expression for the correction factor f=VoutL/Voutf=V_{out}^L/V_{out} as a function of RLR_L, RxR_x and RyR_y. [0,2 т.]

The JFET transistor has a low output resistance when VGS=0V_{GS}=0, namely RDS0∼50 ΩR_{DS}^0\sim50\ \Omega. However, this resistance increases significantly when the Gate is polarised negatively with respect to the Source. For VGS<0V_{GS}<0 the output resistance follows closely the law given by equation (1).

B.4 Using the appropriate correction factors, calculate VDSV_{DS}, the voltage drop between Drain and Source, for all the points measured in B.2. Consider the following nominal data for the JFET used in this problem: RDS0=50 ΩR_{DS}^0=50\ \Omega, VP=−1.4 VV_P=-1.4\ \mathrm V. [1,2 т.]

B.5 Plot the output curves IDS(VDS)I_{DS}(V_{DS}) for your JFET transistor. [0,5 т.]

B.6 Consider the transistor in operation at small VDSV_{DS}. Obtain the experimental values of RDSR_{DS} of your JFET for different VGSV_{GS} and plot the data. [0,5 т.]

B.7 Plot the transfer curve IDS(VGS)I_{DS}(V_{GS}) of your JFET transistor for VDS∼+3 VV_{DS}\sim+3\ \mathrm V. [0,3 т.]

When the JFET transistor is in saturation mode, the current IDSI_{DS} follows closely the law expressed by equation (2).

B.8 From the measured data, obtain IDSSI_{DSS} and the pinch-off voltage, VPV_P, for your device. Compare the value obtained of VPV_P with the nominal value. [0,4 т.]

An important parameter of a JFET transistor, in particular when it is used in amplifiers, is the so called transistor transconductance, gg, defined as

g=∂IDS∂VGS.(3)g=\frac{\partial I_{DS}}{\partial V_{GS}}.\qquad (3)

For a function of two variables f(x,y)f(x,y), the notation ∂f∂x\frac{\partial f}{\partial x} means the derivative of ff with respect to xx when yy is kept constant.

B.9 Obtain, from the measured transfer curve, the transconductance of your device for VGS=−0.50 VV_{GS}=-0.50\ \mathrm V. Compare it with the calculated value obtained from the model equation (2). [0,4 т.]

Part C. The Paper Thin Film Transistor (2.0 points)

From now on, you discard the JFET, and all following tasks and questions relate to the paper thin film transistor (TFT) located in the upper corner of the printed circuit. The TFT Gate, Source and Drain are marked in Figure 10. Connect the TFT Gate and the Source to ground. Also in this part of the problem the Source of the paper TFT should always be connected to the common contact of the battery packs, i.e. 0 V0\ \mathrm V, as shown in Figure 10. Polarise the transistor with VDS>0V_{DS}>0, via one of the voltage circuit dividers (Figure 10). Check that a current is flowing through the ammeter.

Complete native TFT measuring setup including S/G/D contacts, all red current-meter wiring/arrows, batteries, complete printed board and lower return wire.
Figure 10. Setup for measurements on the paper TFT. The picture of the multimeter is merely illustrative: you are in charge of selecting the appropriate measuring mode and range in the rotary selector of the multimeter.

C.1 Apply VDS=+3.0 VV_{DS}=+3.0\ \mathrm V. Close the transistor by applying VGS=−3.0 VV_{GS}=-3.0\ \mathrm V. Wait for 1 min1\ \mathrm{min} so that the the transistor closes. Write down in the answer sheet the residual value of the current, IclosedI_{closed}. Then open the transistor by putting VGS=0V_{GS}=0, while keeping VDS=+3.0 VV_{DS}=+3.0\ \mathrm V. Measure the current as function of time, starting at the instant when you open the transistor, for at least 5 min5\ \mathrm{min} and collect the data IDS(t)I_{DS}(t) in the answer sheet. [0,8 т.]

C.2 Plot IDS(t)I_{DS}(t). There is a superposition of two exponential processes in the time dependence, one with a much larger time constant (τ2\tau_2) than the other (τ1\tau_1). Determine the shorter time constant, τ1\tau_1. [1,2 т.]

Part D. Inverter circuit (1.0 points)

In microelectronic circuitry one of the most important circuits is the inverter, that is able to invert a digital input. For instance if Vin=highV_{in}=\text{high} then Vout=lowV_{out}=\text{low} and vice-versa. A transistor is once again at the basis of the circuit and one of the simplest designs is the so called common source amplifier, depicted in Figure 11, using a transistor and a load resistance (RLR_L). In this case Vin=VGSV_{in}=V_{GS} and VoutV_{out} is the voltage measured at the Drain electrode of the transistor. Thus, in this part we will monitor what happens to VoutV_{out} while sweeping VGSV_{GS} from −3 V-3\ \mathrm V to 0 V0\ \mathrm V.

Complete native common-source inverter schematic, +3V source/RL/Vout/VGS, full TFT symbol with G/S/D and ground.
Figure 11. Common source amplifier and inverter circuit.

In the setup of Figure 11 the transistor is the paper TFT and RLR_L is a load resistance you are going to add now, manually, by connecting the Drain contact of the transistor with the Vin contact using a pencil track, as indicated in Figure 12. While you write, you are actually depositing thin layers of conductive graphite on the paper so the more layers you draw on top of each other, the lower the resistance will get. While drawing RLR_L make sure to continuously monitor its resistance. To pull Vout as close to 0 V0\ \mathrm V as possible the load resistance should be large enough. So, while drawing the resistance, aim for a value close to the target value RL=200 kΩR_L=200\ \mathrm{k\Omega}.

You can either use the pencil to decrease RLR_L or the eraser to increase it. You should aim to obtain a value differing not more than 10% from the aimed value.

Entire inverter apparatus diagram with two batteries, complete printed board, S/G/D and manually drawn load RL track, all return wiring and both track endpoints.
Figure 12. Setup for the inverter/common source amplifier configuration.

Use the included HB pencil and draw by hand a carbon resistor with value of RL≃200 kΩR_L\simeq200\ \mathrm{k\Omega} to be used as a load resistor of the paper TFT to build the inverter circuit (see Figure 12).

D.1 Write down in the Answer Sheet the measured RLR_L value you have reached. Setup the inverter circuit (Figure 12) using the carbon track resistor and the paper TFT. Before the measurement, remember that you should turn the transistor fully off by applying VGS=−3 VV_{GS}=-3\ \mathrm V and wait for ∼1 min\sim1\ \mathrm{min}. Then measure VoutV_{out} as you sweep VGSV_{GS} from −3 V-3\ \mathrm V to 0 V0\ \mathrm V and take readings of VoutV_{out} with a stabilization time for each point up to a maximum of 100 s100\ \mathrm s. Enter the measured values in the Answer Sheet. [0,5 т.]

D.2 Plot the measured Vout(Vin)V_{out}(V_{in}) voltage transfer curve and draw a smooth trend curve through the data points. [0,5 т.]

Native answer sheets

These are the blank forms from the obtained 15-page official answer-sheet companion, in native page order. Blank cells and fields are deliberately left blank. They are not additional tasks or measured data.

Answer sheet A1-1

Write down the numbers 0 to 9 in the following table:

0123456789

Part A: Circuit Dimensioning (2.5 points)

A.1 (0.2 pt)

Vout=‾V_{out}=\underline{\qquad}

A.2 (0.5 pt)

#RT1R_{T1}RT2R_{T2}RT3R_{T3}
Rˉ\bar R
σR\sigma_R

Answer sheet A1-2

A.3 (0.3 pt)

Demonstration:

A.4 (0.4 pt)

R□=‾±‾R_{\square}=\underline{\qquad}\pm\underline{\qquad}

ρCarbon film=‾±‾\rho_{\text{Carbon film}}=\underline{\qquad}\pm\underline{\qquad}

A.5 (0.5 pt)

Demonstration:

Measured values:

R1=‾R_1=\underline{\qquad}

R2=‾R_2=\underline{\qquad}

κ=‾\kappa=\underline{\qquad}

Answer sheet A1-3

A.6 (0.3 pt)

Resistor R1R_1:

PointsRxR_xRyR_y
Z
A
B
C
D
E
F
G
V

Resistor R2R_2:

PointsRxR_xRyR_y
Z
H
I
J
K
L
M
N
W

A.7 (0.3 pt)

PointsVoutV_{out}PointsVoutV_{out}
AH
BI
CJ
DK
EL
FM
GN
VW

Answer sheet A1-4

Part B: Characteristic Curves of the JFET transistor (4.5 points)

B.1 (0.2 pt)

IDS=‾I_{DS}=\underline{\qquad}

B.2 (0.8 pt)

IDSI_{DS} current values:

Gate/DrainZHIJKLMNW
Z
A
B
C
D
E
F
G
V

B.3 (0.2 pt)

f=‾f=\underline{\qquad}

Answer sheet A1-5

B.4 (1.2 pt)

Use the empty columns to enter corrections factors you deem necessary.

Gate A:

VGS=‾V_{GS}=\underline{\qquad}

RDS=‾R_{DS}=\underline{\qquad}

Drain pointVoutV_{out}VoutLV_{out}^{L}VDSV_{DS}IDSI_{DS}

Gate B:

VGS=‾V_{GS}=\underline{\qquad}

RDS=‾R_{DS}=\underline{\qquad}

Drain pointVoutV_{out}VoutLV_{out}^{L}VDSV_{DS}IDSI_{DS}

Answer sheet A1-6

B.4 cont.

Gate C:

VGS=‾V_{GS}=\underline{\qquad}

RDS=‾R_{DS}=\underline{\qquad}

Drain pointVoutV_{out}VoutLV_{out}^{L}VDSV_{DS}IDSI_{DS}

Gate D:

VGS=‾V_{GS}=\underline{\qquad}

RDS=‾R_{DS}=\underline{\qquad}

Drain pointVoutV_{out}VoutLV_{out}^{L}VDSV_{DS}IDSI_{DS}

Answer sheet A1-7

B.4 cont.

Gate E:

VGS=‾V_{GS}=\underline{\qquad}

RDS=‾R_{DS}=\underline{\qquad}

Drain pointVoutV_{out}VoutLV_{out}^{L}VDSV_{DS}IDSI_{DS}

Gate F:

VGS=‾V_{GS}=\underline{\qquad}

RDS=‾R_{DS}=\underline{\qquad}

Drain pointsVoutV_{out}VoutLV_{out}^{L}VDSV_{DS}IDSI_{DS}

Answer sheet A1-8

B.4 cont.

Gate G:

VGS=‾V_{GS}=\underline{\qquad}

RDS=‾R_{DS}=\underline{\qquad}

Drain pointsVoutV_{out}VoutLV_{out}^{L}VDSV_{DS}IDSI_{DS}

Gate V:

VGS=‾V_{GS}=\underline{\qquad}

RDS=‾R_{DS}=\underline{\qquad}

Drain pointsVoutV_{out}VoutLV_{out}^{L}VDSV_{DS}IDSI_{DS}

Answer sheet A1-9

B.5 (0.5 pt)

Output curves:

Entire blank native orange grid for B.5 output curves, all original fine/coarse gridlines and full four boundaries.

Answer sheet A1-10

B.6 (0.5 pt)

VGSV_{GS}RDSR_{DS}

Graph: RDS(VGS)R_{DS}(V_{GS})

Entire blank native orange grid for B.6 RDS(VGS), all fine/coarse gridlines and four boundaries.

Answer sheet A1-11

B.7 (0.3 pt)

Transfer curve:

Entire blank native orange grid for B.7 transfer curve, all fine/coarse gridlines and four boundaries.

B.8 (0.4 pt)

IDSS=‾I_{DSS}=\underline{\qquad}

VP=‾V_P=\underline{\qquad}

B.9 (0.4 pt)

Measured transconductance: g=‾g=\underline{\qquad}

Calculated transconductance from JFET model: g=‾g=\underline{\qquad}

Answer sheet A1-12

Part C: The Paper Thin Film Transistor (2.0 points)

C.1 (0.8 pt)

Iclosed=‾I_{closed}=\underline{\qquad}

ttIIttII

Answer sheet A1-13

C.2 (1.2 pt)

Graph: IDS(t)I_{DS}(t)

Entire upper blank native orange C.2 IDS(t) graph grid, all fine/coarse gridlines and four boundaries.

Auxiliary graph to determine τ1\tau_1:

Entire lower blank native orange C.2 auxiliary graph grid for tau1, all fine/coarse gridlines and four boundaries.

τ1=‾\tau_1=\underline{\qquad}

Answer sheet A1-14

Part D: Inverter circuit (1.0 points)

D.1 (0.5 pt)

RL=‾R_L=\underline{\qquad}

ttVinV_{in}VoutV_{out}

Answer sheet A1-15

D.2 (0.5 pt)

Graph: Vout(Vin)V_{out}(V_{in})

Entire blank native orange D.2 Vout(Vin) graph grid, all fine/coarse gridlines and four boundaries.

Решение

Теми и трудност

Оценена трудност: 4/5.

Електричество · Съвременна физика · Постояннотокови вериги · Полупроводници · Преходни процеси в RC вериги

Предпоставки: Гимназиална подготовка, Разширена олимпиадна подготовка


Оригинал в Архива: exp1.pdf · официални решения: exp1_sol.pdf · допълнителни данни: exp1_anssheet.pdf