IPhO 2008, Експеримент — Задача 1. B. Task 1: Finding the temperature of solidification of a crystalline substance

39th International Physics Olympiad - Hanoi - Vietnam - 2008 · Experimental Problem · DIFFERENTIAL THERMOMETRIC METHOD

Условие

DIFFERENTIAL THERMOMETRIC METHOD

In this problem, we use the differential thermometric method to fulfill the two following tasks:

  1. Finding the temperature of solidification of a crystalline solid substance.
  2. Determining the efficiency of a solar cell.

A. Differential thermometric method

In this experiment forward biased silicon diodes are used as temperature sensors to measure temperature. If the electric current through the diode is constant, then the voltage drop across the diode depends on the temperature according to the relation

V(T)=V(T0)−α(T−T0)(1)V(T)=V(T_0)-\alpha(T-T_0) \qquad (1)

where V(T)V(T) and V(T0)V(T_0) are respectively the voltage drops across the diode at temperature TT and at room temperature T0T_0 (measured in °C), and the factor

α=(2.00±0.03) mV/∘C(2)\alpha=(2.00\pm0.03)\ \mathrm{mV/^{\circ}C} \qquad (2)

The value of V(T0)V(T_0) may vary slightly from diode to diode.

If two such diodes are placed at different temperatures, the difference between the temperatures can be measured from the difference of the voltage drops across the two diodes. The difference of the voltage drops, called the differential voltage, can be measured with high precision; hence the temperature difference can also be measured with high precision. This method is called the differential thermometric method. The electric circuit used with the diodes in this experiment is shown in Figure 1. Diodes D1_1 and D2_2 are forward biased by a 9V battery, through 10 kΩ resistors, R1R_1 and R2R_2. This circuit keeps the current in the two diodes approximately constant.

Circuit diagram: a battery ℰ feeds two parallel branches, each with a resistor (R1, R2) in series with a forward-biased diode (D1, D2); the voltages V1 and V2 across the diodes and the differential voltage ΔV between the two resistor–diode junctions are marked.
Figure 1. Electric circuit of the diode

If the temperature of diode D1_1 is T1T_1 and that of D2_2 is T2T_2, then according to (1), we have:

V1(T1)=V1(T0)−α(T1−T0)V_1(T_1)=V_1(T_0)-\alpha(T_1-T_0)

and

V2(T2)=V2(T0)−α(T2−T0)V_2(T_2)=V_2(T_0)-\alpha(T_2-T_0)

The differential voltage is:

ΔV=V2(T2)−V1(T1)=V2(T0)−V1(T0)−α(T2−T1)=ΔV(T0)−α(T2−T1)\Delta V=V_2(T_2)-V_1(T_1)=V_2(T_0)-V_1(T_0)-\alpha(T_2-T_1)=\Delta V(T_0)-\alpha(T_2-T_1)
ΔV=ΔV(T0)−αΔT(3)\Delta V=\Delta V(T_0)-\alpha\Delta T \qquad (3)

in which ΔT=T2−T1\Delta T=T_2-T_1. By measuring the differential voltage ΔV\Delta V, we can determine the temperature difference.

To bias the diodes, we use a circuit box, the diagram of which is shown in Figure 2.

Orange circuit box seen from above: left sockets 'To D1 - Blue', 'To D2 - Red', 'Common- Black'; two 10 kΩ resistors; right-hand sockets Blue, Red, Red, Black with ΔV marked between Blue and Red and V2 between Red and Black; leads + and − to the 9 V battery at the bottom.
Figure 2. Diagram of the circuit box (top view)

The circuit box contains two biasing resistors of 10 kΩ for the diodes, electrical leads to the 9 V battery, sockets for connecting to the diodes D1_1 and D2_2, and sockets for connecting to digital multimeters to measure the voltage drop V2V_2 on diode D2_2 and the differential voltage ΔV\Delta V of the diodes D1_1 and D2_2.

1. Aim of the experiment

If a crystalline solid substance is heated to the melting state and then cooled down, it solidifies at a fixed temperature TsT_{\mathrm{s}}, called temperature of solidification, also called the melting point of the substance. The traditional method to determine TsT_{\mathrm{s}} is to follow the change in temperature with time during the cooling process. Due to the fact that the solidification process is accompanied by the release of the latent heat of the phase transition, the temperature of the substance does not change while the substance is solidifying. If the amount of the substance is large enough, the time interval in which the temperature remains constant is rather long, and one can easily determine this temperature. On the contrary, if the amount of substance is small, this time interval is too short to be observed and hence it is difficult to determine TsT_{\mathrm{s}}.

In order to determine TsT_{\mathrm{s}} in case of small amount of substance, we use the differential thermometric method, whose principle can be summarized as follows. We use two identical small dishes, one containing a small amount of the substance to be studied, called the sample dish, and the other not containing the substance, called the reference dish. The two dishes are put on a heat source, whose temperature varies slowly with time. The thermal flows to and from the two dishes are nearly the same. Each dish contains a temperature sensor (a forward biased silicon diode). While there is no phase change in the substance, the temperature TsampT_{\mathrm{samp}} of the sample dish and the temperature TrefT_{\mathrm{ref}} of the reference dish vary at nearly the same rate, and thus ΔT=Tref−Tsamp\Delta T=T_{\mathrm{ref}}-T_{\mathrm{samp}} varies slowly with TsampT_{\mathrm{samp}}. If there is a phase change in the substance, and during the phase change TsampT_{\mathrm{samp}} does not vary and equals TsT_{\mathrm{s}}, while TrefT_{\mathrm{ref}} steadily varies, then ΔT\Delta T varies quickly. The plot of ΔT\Delta T versus TsampT_{\mathrm{samp}} shows an abrupt change. The value of TsampT_{\mathrm{samp}} corresponding to the abrupt change of ΔT\Delta T is indeed TsT_{\mathrm{s}}.

The aim of this experiment is to determine the temperature of solidification TsT_{\mathrm{s}} of a pure crystalline substance, having TsT_{\mathrm{s}} in the range from 50°C to 70°C, by using the traditional and differential thermal analysis methods. The amount of substance used in the experiment is about 20 mg.

2. Apparatus and materials

  1. The heat source is a 20 W halogen lamp.
  2. The dish holder is a bakelite plate with a square hole in it. A steel plate is fixed on the hole. Two small magnets are put on the steel plate.
  3. Two small steel dishes, each contains a silicon diode soldered on it. One dish is used as the reference dish, the other - as the sample dish.
Cross-section of the apparatus: a grey cover over a steel plate on the dish holder; the reference dish with diode D1 and the sample dish with diode D2 sit on magnets on the steel plate; a 12V/20W bulb under the plate; leads end in Red, Black and Blue plugs.
Figure 3. Apparatus for measuring the solidification temperature

Each dish is placed on a magnet. The magnetic force maintains the contact between the dish, the magnet and the steel plate. The magnets also keep a moderate thermal contact between the steel plate and the dishes.

A grey plastic box used as a cover to protect the dishes from the outside influence.

Top view of the dish holder: two round dishes labelled D1 (left) and D2 (right) with coiled leads going to a terminal strip, and output leads marked Red, Black and Blue.
Figure 4. The dishes on the dish holder (top view)

Figure 3 shows the arrangement of the dishes and the magnets on the dish holder and the light bulb.

  1. Two digital multimeters are used as voltmeters. They can also measure room temperature by turning the Function selector to the ‘’°C/°F” function. The voltage function of the multimeter has an error of ±2 on the last digit.

Note: to prevent the multimeter (see Figure 9) from going into the “Auto power off” function, turn the Function selector from OFF position to the desired function while pressing and holding the SELECT button.

  1. A circuit box as shown in Figure 2.
  2. A 9 V battery.
  3. Electrical leads.
  4. A small ampoule containing about 20 mg of the substance to be measured.
  5. A stop watch
  6. A calculator
  7. Graph papers.

3. Experiment

1. The magnets are placed on two equivalent locations on the steel plate. The reference dish and the empty sample dish are put on the magnets as shown in the Figure 4. We use the dish on the left side as the reference dish, with diode D1_1 on it (D1_1 is called the reference diode), and the dish on the right side as the sample dish, with diode D2_2 on it (D2_2 is called the measuring diode).

Put the lamp-shade up side down as shown in Figure 5. Do not switch the lamp on. Put the dish holder on the lamp. Connect the apparatuses so that you can measure the voltage drop on the diode D2_2, that is Vsamp=V2V_{\mathrm{samp}}=V_2, and the differential voltage ΔV\Delta V.

In order to eliminate errors due to the warming up period of the instruments and devices, it is strongly recommended that the complete measurement circuit be switched on for about 5 minutes before starting real experiments.

Sketch of the halogen lamp turned upside down: the lamp head lies on the table with the dish holder and cover on top of it, connected by the arm to the round lamp base on the right.
Figure 5. Using the halogen lamp as a heat source

1.1. Measure the room temperature T0T_0 and the voltage drop Vsamp(T0)V_{\mathrm{samp}}(T_0) across diode D2_2 fixed to the sample dish, at room temperature T0T_0.

1.2. Calculate the voltage drops Vsamp(50∘C)V_{\mathrm{samp}}(50^{\circ}\mathrm{C}), Vsamp(70∘C)V_{\mathrm{samp}}(70^{\circ}\mathrm{C}) and Vsamp(80∘C)V_{\mathrm{samp}}(80^{\circ}\mathrm{C}) on the measuring diode at temperatures 50°C, 70°C and 80°C, respectively.

2. With both dishes still empty, switch the lamp on. Follow VsamV_{\mathrm{sam}}. When the temperature of the sample dish reaches Tsamp∼80∘CT_{\mathrm{samp}}\sim 80^{\circ}\mathrm{C}, switch the lamp off.

2.1. Wait until Tsamp∼70∘CT_{\mathrm{samp}}\sim 70^{\circ}\mathrm{C}, and then follow the change in VsampV_{\mathrm{samp}} and ΔV\Delta V with time, while the steel plate is cooling down. Note down the values of VsampV_{\mathrm{samp}} and ΔV\Delta V every 10 s to 20 s in the table provided in the answer sheet. If ΔV\Delta V varies quickly, the time interval between consecutive measurements may be shorter. When the temperature of the sample dish decreases to Tsamp∼50∘CT_{\mathrm{samp}}\sim 50^{\circ}\mathrm{C}, the measurement is stopped.

2.2. Plot the graph of VsampV_{\mathrm{samp}} versus t, called Graph 1, on a graph paper provided.

2.3. Plot the graph of ΔV\Delta V versus VsampV_{\mathrm{samp}}, called Graph 2, on a graph paper provided.

Note: for 2.2 and 2.3 do not forget to write down the correct name of each graph.

3. Pour the substance from the ampoule into the sample dish. Repeat the experiment identically as mentioned in section 2.

3.1. Write down the data of VsampV_{\mathrm{samp}} and ΔV\Delta V with time t in the table provided in the answer sheet.

3.2. Plot the graph of VsampV_{\mathrm{samp}} versus t, called Graph 3, on a graph paper provided.

3.3. Plot the graph of ΔV\Delta V versus VsampV_{\mathrm{samp}}, called Graph 4, on a graph paper provided.

Note: for 3.2 and 3.3 do not forget to write down the correct name of each graph.

4. By comparing the graphs in section 2 and section 3, determine the temperature of solidification of the substance.

4.1. Using the traditional method to determine TsT_{\mathrm{s}}: by comparing the graphs of VsampV_{\mathrm{samp}} versus t in sections 3 and 2, i.e. Graph 3 and Graph 1, mark the point on Graph 3 where the substance solidifies and determine the value VsV_{\mathrm{s}} (corresponding to this point) of VsampV_{\mathrm{samp}}.

Find out the temperature of solidification TsT_{\mathrm{s}} of the substance and estimate its error.

4.2. Using the differential thermometric method to determine TsT_{\mathrm{s}}: by comparing the graphs of ΔV\Delta V versus VsampV_{\mathrm{samp}} in sections 3 and 2, i.e. Graph 4 and Graph 2 , mark the point on Graph 4 where the substance solidifies and determine the value VsV_{\mathrm{s}} of VsampV_{\mathrm{samp}}.

Find out the temperature of solidification TsT_{\mathrm{s}} of the substance.

4.3. From errors of measurement data and instruments, calculate the error of TsT_{\mathrm{s}} obtained with the differential thermometric method. Write down the error calculations and finally write down the values of TsT_{\mathrm{s}} together with its error in the answer sheet.

Отговори

Решение


Оригинал в Архива: exp.pdf · официални решения: exp_sol.pdf